NOVIANDY, T. R.; ZAHRIAH, Z.; YANDRI, E.; JALIL, Z.; YUSUF, M.; MOHAMED YUSOF, N. I. S.; LALA, A.; IDROES, R. Machine Learning for Early Detection of Dropout Risks and Academic Excellence: A Stacked Classifier Approach. Journal of Educational Management and Learning, [S. l.], v. 2, n. 1, p. 28–34, 2024. DOI: 10.60084/jeml.v2i1.191. Disponível em: https://heca-analitika.com/jeml/article/view/191. Acesso em: 18 may. 2026.